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Flash Drive Data Integrity Test: 6 Years Zero Bit Rot

Hacker News •
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A six-year test of Kingston flash drives shows remarkable data stability, with zero bit rot detected across 10 drives storing pseudo-random data. The experiment, which began in 2018, tests one new drive annually while retesting previous drives, then rewrites all tested drives with identical data to maintain consistency.

The testing methodology reveals that flash memory can maintain data integrity far beyond typical usage expectations. Each year, the experimenter tests a new drive, verifies all previously tested drives remain error-free, then rewrites the entire set. This systematic approach provides insights into long-term storage reliability without requiring a decade-long wait for each drive's full lifespan.

Results show 32-GB Kingston drives maintain perfect data integrity through multiple read-write cycles over six years. The testing schedule extends to 27 years, with drives tested at years 1, 2, 3, 4, 6, 8, 11, 15, 20, and 27. This long-term approach demonstrates that flash storage may remain reliable for decades when used for archival purposes, though the experiment continues to gather more data.